Atomic Force Microscopes
Nanometer size probe which scans for surface deflections.
See Also: AFM, Microscopes
-
Product
Acoustic Microscope
AMI D9650
-
Specifically designed to serve as a general purpose tool for failure analysis, process development, material characterization and low volume production inspection, the capabilities of the D9650 are truly unmatched. Representing the latest in C-SAM acoustic micro imaging, the D9650 delivers the unrivaled accuracy and robustness that you would expect from Nordson Test & Inspection instruments, plus improved electronics and software that raises the performance level for laboratory acoustic microscopes.
-
Product
High-end Transmission Electron Microscope
CryoARM
-
JEOL announces the latest member in its family of high-end transmission electron microscopes, the CryoARM. This highly automated TEM is designed for unattended operation and high throughput imaging of cryo-EM specimens. The CryoARM was initially introduced to a select audience at the 2016 Gordon Research Conference in Hong Kong, M&M 2016 in Columbus, OH and EMC 2016 in Lyon, France. The CryoARM is a dedicated cryo-TEM, based on the highly successful JEOL ARM (Atomic Resolution Microscope) series, an ultrahigh performance, highly stable platform considered to be the "best-in-class" TEMs. The development of the CryoARM was accomplished in collaboration with leading Life Science researchers.
-
Product
Scanning Electron Microscope
JSM-IT510
-
Scanning electron microscopes (SEMs) are indispensable tools not only for research but also for quality assurance and manufacturing sites.At those scenes, the same observation processes need to be performed repeatedly and there has been a need to improve the efficiency of the process.
-
Product
Force Measurement Systems
-
Tekscan's load & force measuring systems answer market needs for an economical test & measurement tool.
-
Product
Atomic Resolution Analytical Electron Microscope
NeoARM JEM-ARM200F
-
"NEOARM" comes with JEOL’s unique cold field emission gun (Cold-FEG) and a new Cs corrector (ASCOR) that compensates for higher order aberrations. The combination of a Cold-FEG and ASCOR enables atomic-resolution imaging at not only 200 kV accelerating voltage, but also a low voltage of 30 kV."NEOARM" is also equipped with an automated aberration correction system that incorporates JEOL’s new aberration correction algorithm for automatic fast and precise aberration correction. This system enables higher-throughput atomic-resolution imaging even at low accelerating voltages. Furthermore, a new STEM detector that provides enhanced contrast of light elements is incorporated as a standard unit.
-
Product
Air Force
Alpha 4314 AF
-
4314AF introduces an added safety feature that prevents the possibility of having the charging adapter connected while using the instrument for measurements. A 6-pin Mil-Spec circular connector on the front panel of the 4314AF replaces the four-terminal banana jacks and the battery charger jack. Four of the front panel connector pins are used to mate with the measurement adapter cable and the other two pins are for the battery charging cable adapter. By using separate adapter cables for measurements and charging of the batteries, it ensures that the charge circuit cannot be activated at the same time as measurements are being made.
-
Product
Measuring Microscopes, Image Processing
Milling & Drilling
-
Optik Elektronik Gerätetechnik GmbH
OEG manaufactures all mechanical parts in house and offers these services to other companies.
-
Product
Scanning Probe Microscopes
SpectraView 2500
-
* Ultra-low noise SPM* Colocalized nanochemical analysis by IR, THz, Raman, AFM* Cantilever probes are completely transparent* Versatile configurations: Kelvin Probe chemical potential, electrical, thermal and photon force
-
Product
Force Gauge
-
The Centor range of digital force gauges offers force measurement solutions for every situation. From the simple Centor First II force gauge to the colorful Centor Easy II, we have a wide range of instruments designed for industrial and laboratory use.
-
Product
Electron Microscope Analyzer
QUANTAX EDS for SEM
-
Bruker's latest generation of QUANTAX EDS features the XFlash® 7 detector series, which provides the largest solid angle for X-ray collection (also called collection angle) and the highest throughput.
-
Product
Force Gauges
-
SHIMPO offers a range of digital and mechanical force gauges to suite every application from low capacities (0.5 lbs) to high capacities (1,000 lbs). Our gauge's features range from simple, no output models to highly sophisticated units that provide memory, statistics and data output. Our gauges are known for their strong construction and highly accurate measurements.
-
Product
Atomic Absorption Spectroscopy Consumables
-
Since the atomic absorption spectrophotometer was first launched in 1968, Shimadzu Corporation has remained at the forefront of the world inorganic analysis industry. Shimadzu still maintains an overwhelming market share with highly-regarded products that are selected as the market standard throughout the world. The extensive product range incorporates fully automatic general-purpose systems, a simple and low-cost AA instrument, and a dedicated soil and plant analyzer. They all share great ease-of-use, high functionality, and excellent reliability. Choose Shimadzu to dramatically enhance the productivity and reliability of your laboratory. Shimadzu products will meet all your demands.
-
Product
Radiation Force Balance
-
Radiation force balance for diagnostic and therapeutic medical ultrasound
-
-
Product
Digital Vision Microscopes
-
Sinowon Innovation Metrology Manufacture Ltd.
Video Microscope is widely used in the inspection of electronic industry production line, printed circuit board, weld detects ( such as wrong printing, edge collapse,etc)during printed circuit component, PC Board, VFD, and the identification of printing grid and painting, etc. It can display the zoom out image on the screen and save, magnify and print.
-
Product
STM Microscope
NaioSTM
-
The first scanning tunneling microscope (STM) was developed in 1981 by Gerd Binnig and Heinrich Rohrer at the IBM Research Laboratory in Rüschlikon, Switzerland, for the first time making individual atoms directly visible to a small group of specialists. They were awarded the Nobel Prize in physics in 1986. In 1997, Nanosurf went one step further and brought single atoms to the classroom!
-
Product
Mechanical Force Gauges
-
Imada mechanical force gauges are highly accurate instruments used to test the quality, strength or functionality of component parts or products. Imada mechanical force gauges check both compression and tension (push or pull). Peak force can be captured using the peak indicator needle and the tare ring compensates for the weight of attachments. Imada force gauges are constructed with a heavy-duty metal case and all metal components to enable them to retain their calibration for years with proper care. These mechanical force gauges never need charging or batteries and are intrinsically safe in hazardous environments.
-
Product
Intel Atom® Embedded Controller
AMAX-5570 V2
Embedded Controller
Optimized BIOS & Embedded OS for 1ms real-time control (Windows & Linux)Achieves 32-axis motion control with 500 μs EtherCAT cycle time under LinuxOPC UA and Modbus TCP/RTU as IT connectivity enabled by CODESYSEtherCAT, PROFINET, Ethernet I/P, and CANopen are OT connectivity feature enabled by CODESYSIntel Atom® quad-core x6414RE processorSystem I/O with 2 x GbE, 2 x USB, 2 x Isolated CAN 2.0, 2 x Isolated COM, 1 x HDMI1 x M.2 B-Key (USB3.0 / SATA) expansionAMAX-5000 EtherCAT Slice I/O expansion
-
-
Product
Atomic Layer Deposition Systems
-
Atomic Layer Deposition (ALD) is a powerful way to build ultra-thin, super-precise coatings, one atomic layer at a time. It’s especially useful and efficient when working with tiny, complex 3D structures, making it a go-to technique in advanced semiconductor manufacturing.
-
Product
Digital Microscope
-
A variation of a traditional optical microscope in which a digital/microscope camera is connected, and image output is displayed on a screen and/or monitor. Most models include software and a computer for use.
-
Product
Force Sensors And Strain Sensors
-
Force and strain measurement in machines, installations, and tools.
-
Product
Laser Scanning Microscope
OLS4100
-
The LEXT OLS4100 is a Laser Scanning Microscope to perform non-contact 3D observations and measurements of surface features at 10 nanometer resolutions. It also features a fast image acquisition and a high-resolution image over a wider area.
-
Product
Digital Microscope
VHX-6000 Series
-
Next-generation optical microscope with a large depth-of-field and advanced measurement capabilities for inspection and failure analysis.
-
Product
Measuring Microscopes, Image Processing
Measuring Microscopes
-
Optik Elektronik Gerätetechnik GmbH
Image processing software for dimensional measurements, motorized measuring microscopes and fully automatic measuring machines.
-
Product
Atomic Absorption Systems
-
Agilent leads the industry with innovative atomic absorption (AA) instruments. The entry-level SpectrAA 55B is ideal for labs in remote locations, while the 240FS and 280FS AA systems achieve the productivity of sequential ICP with Agilent’s Fast Sequential technology. The 240Z and 280Z AA systems provide superior performance and accurate background correction with transverse Zeeman technology. Our AA Duo systems feature unique simultaneous operation of both the flame and graphite furnace.
-
Product
Sapphire 3D Microscope
WDI-2000
-
The Sapphire 3D Microscope: HS-WDI-2000 was designed with high quality lighting parts and a good optical system design,can get a very clear image.with the digital camera,it can provide the image in time, widely used in LED,Solar,SEMI…
-
Product
Laser Scanning Microscopes
-
A confocal laser scanning microscope scans a sample sequentially point by point, or multiple points at once. The pixel information is assembled into an image. As a result you acquire optical sections with high contrast and high resolution in x, y and z .
-
Product
Stereo Microscopes & Macroscopes
-
Leica Microsystems offers customized stereo microscopes for research, industry and education. Our macroscopes for industry, medicine and research offer exceptional optics and ultra convenient operation. Stereo microscopes and macroscopes from Leica enable you to view, analyze and document your specimens in two and three dimensions for any application.
-
Product
Ergonomic Force Gauges
DMG Series
-
AMETEK Sensors, Test & Calibration
The DMG ergonomic gauge lets you objectively measure manual muscle strength and functional task requirements for almost any application.
