Simulation
the approximation of actual operational conditions.
See Also: Simulators, Simulation Software, Simulation Testing, Modelling, Emulation
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High Intensity Pulsed Solar Simulator
GEN 2
Alpha-Omega Power Technologies, LLC.
The GEN 2 pulsed solar simulator and data acquisition systems can generate over 1,200 suns with a spot size of 12 mm x 12 mm at a rate of 2 pulses per second.
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Barometric Pressure Simulation
SimBARO
Embedded and Integrated GPS/Inertial navigation systems require an altitude reference data input provided by a barometric pressure altimeter to reduce vertical plane errors inherent within inertial systems. Spirent’s SimBARO product offers a simulated source of barometric pressure altitude data and is available as an add on to SimINERTIAL, Spirent’s Inertial Measurement Unit (IMU) and Embedded GPS/Inertial navigation system (EGI) test tool.
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Yellowing Resistance Chamber
Sataton Instruments Technology CO., Ltd
Yellowing resistance chamber also called as discoloration meter is the professional testing instrument for measurement of yellow resistance performance by simulating sunlight. It is a useful tool for testing the yellowing resistance property of light color materials or products such as white thermoplastic polyurethane elastomer shoe sole or light synthetic materials. The chamber can also be used for printing and packaging industry for deploying chemical dyes.
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Connector and Breakout Box
ES4640
The ES4640 Connector Box offers a standardized wiring and connectivity for HiL testing systems in the powertrain domain. Its front panel provides connectors for the ECU, CAN bus communication, on-board diagnostics, and LEDs for ignition and injectors. Its rear panel connects loads, failure simulation, and other components. Sample applications of the ES4640 are closed loop HiL systems for 8 cylinder gasoline and diesel engine ECUs.
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Cycle Voltage Drop (Rise) Simulator
STT-CSS-20P1
Beijing KeHuan Century EMC Technology Co,.LTD
*Using 2 The regulator, and the rated voltage adjustable automatic voltage regulator, power fluctuations avoid adversely affecting the test results. Simulate the test under 110V power supply. It can simulate the fluctuation of the power grid under extreme conditions (such as high or low power supply voltage in remote areas).
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PXI BRIC4 FIBO Matrix Dual 62x4 2pin brkout
40-592A-012
The 40-592A FIBO (Fault Insertion Break-Out) Matrix Module is a large-scale high density switching matrix based on the Pickering BRIC format. The fault insertion BRICs are designed for applications requiring the simulation of a variety of faults in complex, high pin count, applications involving sensors and control units. Typical faults that can be simulated are open-circuits, short circuits to ground or battery, or short-circuits between input/output lines.
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*C Series CAN Interface Module
C Series CAN Interface Modules communicate using onboard transceivers for High-Speed/Flexible Data‑Rate or Low-Speed/Fault Tolerant CAN. C Series CAN Interface Modules are either compatible with NI-XNET or the NI-985x driver, depending on model.Using NI-XNET, you can create applications that require real-time, high-speed manipulation of hundreds of CAN frames and signals. The NI-XNET device-driven DMA engine enables the onboard processor to move CAN frames and signals between the interface and the user program without CPU interrupts, minimizing message latency and freeing host processor time. C Series CAN Interface Modules work well in applications such as hardware-in-the-loop (HIL) simulation, rapid control prototyping, bus monitoring, and automation control.
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PXI High Density Precision Resistor Module, 4-Channel, 3Ω to 52.4kΩ
40-298-133
The 40-298-133 is a high density programmable resistor module with 4 channels which can be set between 3Ω and 52.4kΩ with 1Ω resolution The 40-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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4, 8, 16 And 32 ChannelARINC429 Test And Simulation Modulefor PCI Express
APE429-x
ARINC429 Test and Simulation modules with 4, 8, 16 or 32 Software programmable Tx/Rx channels plus up to 8 Discrete I/O’s. The APE429-x is a functional replacement for the models API429-x/APX429-x.
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Software to Simulate Large Area Semiconductor Devices
Laoss
Laoss is a powerful software to simulate large area semiconductor devices (OLED, thin-film PV), taking into account the voltage drop in the electrodes due to important resistive effects when the size of the device increases.Simulation of large area semiconductor devices (OLED, thin-film PV)Coupling law input: analytical or tabulated (experimental or simulated) IV curveDevice optimization (electrode material, device geometry etc...)High speed computation
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PXI Precision Resistor Module 9-Channel, 2 to 13.6k
40-297-031
This 9-channel PXI Precision Resistor Module provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-297 series is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Stand-alone I-V Test Systems
OAI offers a complete line of high performance I -V Testers. I -V Testers and I -V Rider software may be ordered as a stand -alone system or integrated into any OAI Solar Simulator. Three standard ranges of I -V Testers are available; ≤1A, 1 -5A, 5 -10A, and 20A. Higher current testers are available as custom options. An OAI Application Engineer will work with you to insure that the I -V Tester and I -V Rider software you choose is optimized for your specific application.
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IPX56 Simulation Rain Test Chamber
CX-IPX56A
Shenzhen Chuangxin Instruments Co., Ltd.
IPX56 Simulation Rain Test Chamber widely used in the lamps and electrical and electronic product certification testing institutions and for testing the waterproof of electrical and electronic products of shell protection level.
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Multifunction Reconfigurable I/O Device
Multifunction Reconfigurable I/O Devices feature a dedicated A/D converter (ADC) per channel for independent timing and triggering. This design offers specialized functionality such as multirate sampling and individual channel triggering, which are outside the capabilities of typical DAQ hardware. You can customize these devices with the LabVIEW FPGA Module to develop applications requiring precise timing and control such as hardware-in-the-loop (HIL) testing, custom protocol communication, sensor simulation, and high-speed control.
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Structural Engineering And Design
AEC
Altair's architecture, engineering, and construction (AEC) solutions offer unparalleled productivity for building and non-building structures with their advanced versatility, integration, and data management capabilities. Our analysis and design solutions simulate responses to a range of dynamic, nonlinear loading conditions, including wind, snow, water, seismic, blast, dead, live, and moving loads – all while ensuring design resiliency and regional code compliance.
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Creates a Scientific Management Environment
Biovia
The industry-leading BIOVIA portfolio is focused on integrating the diversity of science, experimental processes, and information requirements across research, development, QA/QC, and manufacturing. Capabilities cover scientific data management; biological, chemical, and materials modeling and simulation; open collaborative discovery; scientific pipelining; enterprise laboratory management; enterprise quality management; environmental health & safety; and operations intelligence.
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68HC11D Simulator
SIM11D
Simulate your M68HC11 microcontroller designs on your personal computer. Helps find hidden errors easily and efficiently.
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PXI/PXIe High Density Precision Resistor Module, 3-Channel
40-297A-143
The 40-297A-143 (PXI) and the 42-297A-143 (PXIe) are 3-channel programmable resistors with a range of 2.5 Ω to 773 kΩ. They are part of the 40/42-297A series of high density precision resistor modules and provide a simple solution for applications requiring accurate simulation of resistive sensors.
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Multichannel Interface Card
DAS-429mPCIe/RT8-717
The card complies with the PCI Express support one lane 2.5 Gbps PCI Express. The card’s small size and suitability for Mini Card compatible computers make it a complete solution for developing, testing, integrating ARINC 429 and ARINC 717 interfaces and for performing system simulation both in the lab and in the field.
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Power Temperature Cycling
Typically, this test would be selected when during its normal operating activity, the device is subjected to high temperature excursions and is required to power on and off at all temperatures. The power and temperature cycling test will determine the ability of a device to withstand exposure to such temperature extremes with operating biases periodically applied and removed. The worst case conditions expected in a typical; application will be simulated.
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Mobile Comm DC Source w/ Battery Emulation, DVM
66321D
The Keysight Mobile Communications DC Source 663xx series offers several features ideal for testing wireless and battery powered devices. Excellent voltage transient response ensures maximum test-system throughput by minimizing device shutdowns due to significant voltage drops in the test wiring. Built-in advanced measurement system to accurately measure battery current drains when the device operates in different modes and a Keysight-developed feature that enables cellular telephone manufacturers to detect permanently and intermittently open-sense wire connections.The Keysight 66321D mobile communications dc source provides fast transient response, exceptional sourcing, output resistance programming, and precision measurement. This product is specially designed for testing next generation digital wireless communications products. The 66321D mobile communications dc source offers a new capability that simulates the internal resistance of a battery or battery pack. Additionally, these high performance models offer improved transient response and stable output operation with either short or long load leads. The 66321D dc source provides all of the capabilities of the 66321B with the addition of a built-in digital voltmeter.
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PXI High Density Precision Resistor Module, 6-Channel, 3.5Ω to 773kΩ
40-298-043
The 40-298-043 is a high density programmable resistor module with 6 channels which can be set between 3.5Ω and 773kΩ with 1Ω resolution The 40-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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PXI Precision Resistor Module 6-Channel, 3 to 2.97M
40-297-051
A simple solution for applications requiring accurate simulation of resistive sensors. The series is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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PCI 3-Channel Precision Resistor Card
50-297-103
The 50-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Wafer/Chip/Package Semi-automated ESD Tester
400SW
Tokyo Electronics Trading Co., Ltd.
Semi-automated ESD tester featuring Ecdm 400E, Universal ESD Simulator. Used with a manual wafer probing system or a die manipulator, wafer or die level semi-auto ESD test can be done, as well as packaged device test. Damage is detected by V-I curve or leakage current change detection. Stress level and measurement points are programmed by personal computor via GP-IB. Once test terminals are selected, ESD endurance is automatically measured.
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Bidirectional DC Power Supply + Regenerative Load
62000D
Chroma Systems Solutions, Inc.
Chroma 62000D programmable bidirectional DC power supplies have both power source and load characteristics, two quadrant operation, and allows feedback of the power from the DUT. They can be used for testing renewable energy power systems including PV/storage hybrid inverters, power conversion system (PCS) on charging/discharging, and as a battery simulator. The 62000D also is a fit for testing power components used in electric vehicles, such as bidirectional on-board chargers (BOBC), bidirectional DC convertors, and DC-AC motor drivers, and power conversion simulation tests of batteries in both directions.
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DC Electronic Load
DC electronic loads are designed for testing a wide range of power conversion products including AC/DC and server power supplies, DC/DC converters, EV batteries, automotive charging stations, and other power electronics components. These units can be synchronously paralleled up to 240kW and dynamically synchronized for generating complex multi-channel transient profiles. The 300% peak overpower capability provides extra headroom for fault condition simulations in automotive batteries, fuel cells, and more.
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ESD Test Simulator
ONYX16
The ONYX is a state of the art electrostatic discharge simulator available in 16kV or 30kV versions. It is the most ergonomic 30kV ESD gun without an additional base control unit that can be battery or mains operated. The easy to use touch screen, ergonomic design, modular RC units, multilingual interface, remote control software, built-in LED light and temperature & humidity display allows for trouble-free use of the ONYX in all types of test sites.
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Torque Carts
AIMCO offers torque carts for "lineside" or "point of use" tool validation and calibration. Our torque carts allow testing of tools on repeatable joint simulators and "in process" use on production joints, allowing users to identify process capability. There are multiple torque cart options:
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Diamond Authenticity Testing
The International Institute of Diamond Grading & Research
These services fully test all goods to verify diamonds, identify synthetics and simulants, and then return them in tamper evident sealed parcels with clear labelling as to the nature of their contents.Our laboratories are in three global locations: Antwerp, Surat, and Maidenhead. At all our facilities, our experts use comprehensive analysis using a variety of different in-house and proprietary equipment to ensure that every diamond we assess is natural.
