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Product
InfiniiMax II Series Probe Amplifier, 12 GHz
1169B
Amplifier
Provides a large common mode range and a large offset range for measuring differential and single-ended signals.
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Product
3-Axis Hall Probe H
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The 3-axis Hall Probe H is a cutting-edge solution designed for precise magnetic field measurements across various applications. With its thin (0.75 mm) and fully integrated design, this Hall probe offers an exceptional level of spatial resolution and is engineered for high-performance tasks that require real-time data on magnetic flux density. It provides simultaneous analogue voltage outputs for all three magnetic field components (Bx, By, and Bz) as well as the probe's temperature, making it ideal for advanced applications in research and industrial sectors.Available in three different lengths—71 mm for the long variant (HL), 47 mm for the medium variant (HM), and 8 mm for the small variant (HS)—the Hall Probe H caters to diverse measurement scenarios. Its compact design is achieved through the incorporation of a CMOS integrated circuit that integrates Hall elements, biasing circuits, amplifiers, and a temperature sensor in a single chip. This integration results in high angular accuracy, with mutual orthogonality between the three measurement axes maintained to within ±1°, achieved through enhanced calibration techniques. Whether you need high frequency bandwidths up to 25 kHz or temperature compensation capabilities, the Hall Probe H meets stringent technical requirements while ensuring durability through its alumina-ceramic packaging.
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Product
CMP Mechanical Kits (280x138mm)
230198 – CMP-290-HP
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The CMP Mechanical kits are an excellent option for manual tests of both low and high volumes. Now in a more rigid design with removable probe plate for easier maintenance. Integrated fixture down switch as an option. The kit is available in 4 standard sizes but can be adjusted to your demands.
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Product
Changeable Cassette
230356/1 – CMK-07
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Linear click system with ball bearings, using gas springs.10 mm ESD-proof top cover with aluminum reinforcement bars.Steel base cabinet with detachable aluminum back and bottom panels.Detachable interchangeable case system with an 8 mm spring-loaded probe protection cover.Base cabinet fitted with a telescopic guide rail and catch.
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Product
Profilometer
MicroCam™
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MicroCam™ fiber-based optical non-contact 3D profilometers deliver: High-Speed Non-Contact Surface and Cross-Sectional Inspection 3D Online Measurements, GD&T and Imaging Long Stroke Profilometry with Sub-Micron Resolution Thickness, Roughness and Vibration Measurements Fiber-based Probes which reach into Bores, Tubes, and Crevices
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Product
Flat, Alternate 0.78 (22.00) - 3.70 (105.00) General Purpose Probe
HPA-0F-1
General Purpose Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 67Recommended Travel (mm): 1.70Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 635Overall Length (mm): 16.13
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Product
Coating Thickness Meter
MEGA-CHECK DX
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The List-Magnetik MEGA-CHECK DX Coating Thickness Gauge can be connected to a wide range of specialized digital probes. Applications on very small apertures, thick layers and small measuring points are easily possible.
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Product
Alternate 2.50 (71.00) - 5.80 (164.00) General Purpose Probe
P2665G-1V2S
General Purpose Probe
Current Rating (Amps): 15Average DC Resistance lower than (mOhm): 10Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 230Full Travel (mm): 5.84Recommended Travel (mil): 167Recommended Travel (mm): 4.24Overall Length (mil): 1,290Overall Length (mm): 32.77Overall Length Remark: Tip 2W: 1270 mil (32.26 mm)
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Product
Manual Flying Probe Test Systems
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They provide flexible measurement technologies like Kelvin and high voltage tests in combination with low tooling costs. atg Luther & Maelzer offers a wide range of different systems starting from standard systems with 8 heads up to oversized systems with 24 test heads.
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Product
Alternate 2.58 (73.00) - 6.00 (170.00) High Performance Lead Free Probe
LFRE-25H79-6
ICT/FCT Probe
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Alternate 2.39 (68.00) - 6.00 (170.00) High Performance Bias Ball Probe
POGO-1L24-6-S
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
BMP-4 Board Marker Probe
BMP-4
ICT/FCT Probe
Current Rating (Amps): .020Voltage Rating (VDC): 12Recommended Duty Cycle: 2 sec. On (min.), 3 sec. OffTest Center (mil): 1,000Test Center (mm): 25.40Full Travel (mil): 79Full Travel (mm): 2.01Recommended Travel (mil): 50Recommended Travel (mm): 1.27Full Marker Travel (mil): 62Full Marker Travel (mm): 1.57Direction of Rotation: CCWScribed Diameter (mil): 50Scribed Diameter (mm): 1.27Test Center Remark: Ø .398 (10.1) or M10
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Product
Light 0.83 (24.00) - 2.00 (57.00) High Performance Bias Ball Probe
POGO-1L-2-S
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Adapter/Stainless Steel
WADP-24F24F-4H
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Warison provides wide range of wireless passive coaxial components, includes Adapters, Attenuators, Coaxial Cables Assemblies, DC Blocks, Filters, Isolators & Circulators, Probes & Terminations. With outstanding capability of development and design, Warison is able to custom the spec based on customer��s demand. All Warison��s products pass inspection and electronic performance test before shipping out. It is our principal to deliver the best solution to all our clients.
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Product
General Purpose Test Probes
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Low profile, short travel test probes for restricted space applicationsApplications where long travel is not required such as thin film/hybrid circuits or bareboard PCB testingReplaceable test probe by use of a receptacle
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Product
Wafer Probe Heads
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WLCSP test is the applying final test conditions at Wafer Level. WLCSP testing is driven in lowering the cost of test of devices through economical methods of manufacturing and testing.
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Product
Alternate 2.39 (68.00) - 6.00 (170.00) High Performance Bias Ball Probe
POGO-1H-6-S
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Surface & Volume Low Resistivity Meter for Conductive Materials
Loresta GP
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The Loresta GX Meter is an intelligent, multi purpose low resistivity meter equipped with software that calculates resistivity correction factors. A variety of 4 pin probes are available for use with the Loresta GX. The instrument is typically used in Product Engineering, R&D, and Quality Control. Applications include measurement of conductive paint, conductive plastics, conductive rubber, conductive film, silicon wafers, antistatic materials, EMI shield materials, conductive fiber, conductive ceramics, etc.
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Product
Combined Temperature – RH probe
HP474ACR
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Combined Pt100 temperature and %RH probe, complete with SICRAM module.
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Product
Constant Distance SECM
VS-STYLUS
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In collaboration with SENSàSION, we are pleased to offer the Soft Stylus Probe contact mode technique developed by Professor Hubert Girault and co-workers of the Laboratory of Physical and Analytical Electrochemistry (LEPA) at the École Polytechnique Fédérale de Lausanne (EPFL) for constant distance SECM. The probe technology offers the following benefits:
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Product
Low Voltage Differential Oscilloscope Probes
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Differential signaling used in high speed serial standards requires very accurate characterization. The industry-leading bandwidth and signal fidelity found in a Tektronix low voltage differential oscilloscope probe ensures that you see every possible detail. Tektronix offers TriMode™ architecture which streamlines measurement acquisition by enabling you to make differential, single-ended, and common mode measurements with a single connection!
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Product
Passive Probe, 10:1, 200 MHz, 1.3 M
N2871A
Oscilloscope Probe
Compact 2.5-mm probe head diameter, low input capacitance, and various fine-pitch probe tip accessories make the Keysight N2870A Series passive probes ideal for probing densely populated IC components or surface-mount devices used in today’s high-speed digital applications.
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Product
Grypper
Grypper
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*Package-size PCB footprint: Since the PCB footprint of Grypper is identical to or smaller than the IC package, only one PCB design is required, enabling a seamless transition from test and validation through production and reducing overall cost of test*No lid required: The package snaps directly without a lid, enabling easy probing, scoping and troubleshooting the topside of the device*Excellent signal performance: A short signal path achieves low inductance and low insertion loss, providing a nearly invisible electrical connection
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Product
Passive Probe, 10:1, 500 MHz, 1.2 M
N2843A
Oscilloscope Probe
The Keysight N2843A low-cost passive probe provides a 10:1 attenuation and features a high input resistance of 10 MΩ. The probe can be adjusted for low-frequency compensation and high-frequency compensation.
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Product
Compact Inspection Camera
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Fits in your pocket or clips on your beltAffordable1 meter drop-proofLong, thin camera-tipped probe with excellent depth of field penetrates tight, hard-to-reach spacesProbe is waterproof, holds its configured shape, and coils inside clamshell case for storageFour camera-lighting LEDs produce bright, crisp video on large color LCDFour screen controlsFour useful probe tip accessories (pickup hook, magnetic pickup, 45 mirror, thread protector)
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Product
Micropositioner
S-725
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Primarily used for probing targets that are approximately 0.5 mil (12.7 microns) and larger, with 80 TPI resolution.
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Product
Automated Bare Board Tester with Built-In Camera
QTOUCH2404C
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Qmax Test Technologies Pvt. Ltd.
Qtouch2404C – Automated Bare Board Tester with in-built camera is designed to make automatic image capturing and probing of bare PCBs. It is designed to move on X,Y,Z directions making it possible to probe every test point. Flying Probe Tester is designed for testing high density fine pitched Single Sided / Double Sided and Multilayer PCBs for continuity and isolation using moving probes fixture –less technology.
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Product
High 1.73 (49.00) - 8.00 (127.00) High Performance Lead Free Probe
LFRE-1Z1-8
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
1kV, 120 MHz High Voltage Differential Probe with Auto Zero Disconnect
HVD3106A
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The HVD3000A series of high voltage differential probes cover the fullest range of applications, from 120/240 V switch-mode power supplies through 600 V class and 5 kV electrical apparatus. The table below provides a list of recommended probe models based on specific device under test applications.
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Product
Clamp Meters
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Shenzhen UYIGAO Electronic Technology Co., Ltd
Combine meter and current probe into integrated instrument.
