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Product
Heavy Duty Circuit Tester with Retractable Wire & Long Probe
27250
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Features an extra long wire that stretches up to 12 feet for use, then automatically retracts. Quickly and easily check electrical circuits and accessories on 6 and 12 volt systems. Great for use on cars, trucks, boats, trailers, motorcycles, airplanes and snowmobiles. Heavy duty ground clip with insulator. 6 1/2" long, insulated probe.
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Product
Passive Probe, 10:1, 75 MHz, 2-Pack
N2142A
Oscilloscope Probe
The Keysight N2142A is an extremely low-cost passive probe that provides a switchable 10:1 / 1:1 attenuation and up to 75 MHz bandwidth. It features a high input resistance of 10 MΩ (switchable to 1 MΩ) to address a wide range of measurement needs with low probe loading. The probe can be adjusted for both low-frequency compensation and high-frequency compensation. For the best measurements, you should compensate your probe to match its characteristics to the oscilloscope. This probe is compatible with Keysight InfiniiVision Series oscilloscopes with 1 MΩ input.
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Product
Temperature Data Logger
U0843M
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The Datalogger is designed to record from two external temperature probe, two two-state input. In case of exceeded set limits, SMS and JSON messages can be sent via GPRS data connection. It is possible to set the regular sending of JSON messages to Comet Database, the sending interval is adjustable.The recording is performed in a non-volatile electronic memory. The data can be transferred to a PC via USB-C.
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Product
K Thermocouple Magnetic Contact Probe
TP757
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Magnetic thermocouple type “K” probe for measurements on magnetic metal surfaces.
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Product
Battery Probes
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C.C.P. Contact Probes Co., LTD.
CCP offers a variety of different high current battery testing probes.
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Product
Probe And Test Adaptors Set (13PCS)
3601B
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Peaceful Thriving Enterprise Co Ltd
1. Extra thin test probe.2. Flexible silicone cable.3. For use in conjunction with test probe.4. Bi-color test leads for polarity indication.5. High quality testing and test accessories.
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Product
Surface Resistance Meter
WL MIDGET
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WL MIDGET Surface Resistance Meter is an ultra-wide range, battery operated, portable instrument for measuring Surface Resistivity and Resistance to Ground of virtually any flat surface conforming to ASTM D-257 standard method by using recommended parallel bar sensing probe. Gives simple, repeatable measurements of conductive, static dissipative, and insulative surfaces. Ranging is automatic due to the use of high-speed OP-AMP Integrated circuits being linear, with changeover points +1/2 decade on a logarithmic scale. Repeatability equals + 5%.
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Product
IDE, Compiler And Debugger
RiscFree™ SDK
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RiscFree is Ashling’s cross platform SDK including an IDE and Debugger, Integrated Compiler Toolchain, Project Manager and Build System, Single-shot Installer and Source-code Creation and Navigation. The integrated Debugger provides full Multi-core Homogeneous and Heterogeneous Support including debug and trace support via the Ashling Probes for RISC-V, Arm, ARC, ARC-V and MIPS based cores
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Product
AWS Probes For Ultrasonic Weld Seam Testing (ASTM)
SONOSCAN R
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The robust ultrasonic probes with BNC connector allow a fast scanning over comparatively large areas with high precision and repeatability. Both our own and third-party wedges can be attached to our probes. . Thanks to the different types of wedges various material tests can be performed.
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Product
Standard 2.00 (57.00) - 3.60 (102.00) General Purpose Probe
P2664G-1W1S
General Purpose Probe
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 10Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 114Full Travel (mm): 2.90Recommended Travel (mil): 84Recommended Travel (mm): 2.13Overall Length (mil): 895Overall Length (mm): 22.73Overall Length Remark: Tip 1C: 845 mil (21.46 mm) Tip 2R: 935 mil (23.75 mm)
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Product
In Line HT Ignition Tester
1177
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Establishes whether there is a high tension spark potential at the spark plug. Hands free operation means no risk of electric shock to user. Ideal for modern vehicles with sensitive electronics. Probe is 55mm long with a lead 100mm in length.
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Product
2.92mm to ProBus Probe Adapter
L2.92A-PBUS
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The Teledyne LeCroy LabMaster 10 Zi oscilloscope utilizes precision 2.92mm input connectors to achieve up to 36GHz of input bandwidth. But some applications may require the use of lower-bandwidth probes for performance and cost reasons.The L2.92A-PBUS adapter converts the 2.92mm interface to a ProBus interface. This brings the benefits of a wider selection of probes to the LabMaster 10 Zi from high-impedance ZS active probes to the high-bandwidth WaveLink differential probing system. Full probe power and control is provided through a built-in LEMO interface.
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Product
S2 Penta High-Sensitivity Sensors
ULP S2 PCI/V HS
LED Sensor
The Universal LightProbe S2 Penta High Sensitivity Sensor features the same popular built-in color binning as the regular S2 Penta Sensor, and is designed test extremely dim LEDs, providing an analog output for intensity, ranging from 0 to 4 volts, corresponding to the LED’s luminous intensity in millicandelas. Implemented in a unique and customizable 2-Part solution, the S2 Penta High Sensitivity Sensor is assembled with your choice of Fiber-Optic Probe, including for the test of densely-spaced LEDs, bright LEDs, dim or misaligned LEDs, right-angle LEDs, and more, including the popular “Trident” Fiber-Optic Probes to sequentially test 3 LEDs with a single Sensor.Operating temperature range: 0oC to 70oCPower consumption: Operates between +5 and 28 volts D.C., at 6mA max. Less than 4.75 volts is not recommendedVoltage protection: Withstands up to +40 volts, & reverse polarity to -18 voltsOutput Pins: 4 gold-plated standard wire-wrap pins (0.025 in. sq.)Sensor Size: 0.560 in. dia x 1.38 in. longTypical response times: <1.2s color & intensity outputs simultaneously (the brighter the LED, the shorter theresponse time)Fiber-Optic Probes: Wide Aperture Fiber-Optic Probe recommended
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Product
Elevated 2.65 (75.00) - 6.50 (184.00) High Performance Lead Free Probe
LFRE-25J-6.5
ICT/FCT Probe
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Ultra High 1.77 (50.00) - 10.00 (283.00) High Performance Lead Free Probe
LFRE-25L36-10
ICT/FCT Probe
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Standard 3.00 (85.00) - 6.00 (170.00) Non Replaceable General Purpose Probe
G-S-F
General Purpose Probe
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 30Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 67Recommended Travel (mm): 1.70Overall Length (mil): 780Overall Length (mm): 19.81Rec. Mounting Hole Size (mil): 86Rec. Mounting Hole Size (mm): 2.18Recommended Drill Size: #44
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Product
Differential Probe
DP-25
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*Econmical High Voltage Model*25MHz/1400Vp-p Max.*3 Range: x20/ x50/ x200*Input Impedance 4MΩ//1.2PF*Separating Design(Standard No.114205) Convenient & Durable.
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Product
Standard 5.95 (169.00) - 7.55 (212.00) Switch Probe
MSP-25C
Switch Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 50Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 125Full Travel (mm): 3.18Recommended Travel (mil): 85Recommended Travel (mm): 2.16Mechanical Life (no of cyles): 100,000Overall Length (mil): 1,690Overall Length (mm): 42.93Switch Point (mil): 30Switch Point (mm): 0.76
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Product
Benchtop Test System
300 Series Benchtop ATE
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The Circuit Check 300 Series benchtop ATE Test Platform with built-in professional fixturing solves the uncertainty of repeatable results that are common with bench testing. With the 300 Series Benchtop ATE, test procedures can become automatic, with test steps and go/ no-go limits easily programmable in common tabular form. Hand-probing is eliminated, replaced with accurate, repeatable tooling and reliable spring-loaded test probe fixturing.
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Product
Alternate 2.52 (71.00) - 6.50 (184.00) General Purpose Probe
EPA-3D-1
General Purpose Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 35Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Ultra High 4.09 (116.00) - 10.00 (283.00) General Purpose Probe
EPA-2G40-2
General Purpose Probe
Current Rating (Amps): 5Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 160Full Travel (mm): 4.06Recommended Travel (mil): 107Recommended Travel (mm): 2.72Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 970Overall Length (mm): 24.64
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Product
Spot Sensor
SP 1000-20R1
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Advanced Thermal Solutions, Inc.
The SP 1000-20R1 is a single-sensor probe designed for measuring the surface temperature of solids. Its small size allows for the exact positioning of the sensor at the desired spot. The size of the sensor eliminates any conductive heat transfer that may occur through the lead wire, enhancing measurement accuracy.
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Product
CMOS Image Sensor
CIS
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CMOS Image Sensors (CIS) allow multiple camera functions in mobile devices, automobiles and security systems. Nidec SV Probe provides both standard and advanced versions of our CIS cards employing a wide variety of materials ensuring a durable cost-saving solution that can meet the fine pitch and multi-dut challenges of these devices. Other features and benefits include: • Proprietary AC™ Alloy Probes • Reduced Damage Under the Pad • High Frequency Capability • Better Alignment StabilityOur advanced CIS card, the Multiplexer™, is offered specifically for high density and high parallel applications. The Multiplexer™ is built with cantilever needles held into place on one side and shorter AC™ probes on the other which leads to a more stable electrical characterization over other CIS probe card options.Contact your Nidec SV Probe Representative so we can help you find the right CIS product for your testing needs.
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Product
Linear Testfixture (Cassette Not Included), UTT 456 x 320 mm
MG-07
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FEATURES• Linear click system with ball bearings, using gas springs• 10 mm ESD-proof top cover with aluminium reinforcement bars• Steel base cabinet with detachable aluminium back and bottom panels• Detachable interchangeable case system with an 8 mm spring loaded probe protection cover• Base cabinet fitted with a telescopic guide rail and catchTECHNICAL SPECIFICATIONS• Max. number of probes (2000N) 1300 units• Max. PCB height: 60 mm• Linear travel: 12 mm• Max UUT: 456 x 320 mm (wxd)• Outer dimensions: 620 x 590 x 100 x 184 mm (wxdxh1xh2)• Designed for changeable cassette
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Product
Magnetic Field Tester
Rotor-Check 400
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Rotor-Check 400 is a practical testing device used to check the magnetic field strength curve of a rotor. The device and measuring probe connect directly to a Windows PC via USB. It is an ideal solution for precise magnetic field measurement and analysis.
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Product
Light 0.60 (17.00) - 2.00 (57.00) Bead Probe
BTP-72F-2
Bead Target Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Overall Length (mil): 1,700Overall Length (mm): 43.18
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Product
InfiniiMax Probe, 3.5 GHz
1131B
Oscilloscope Probe
Provides extremely low input capacitance, flat frequency response, and patented resistor probe tip technology.
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Product
CAM/TRAC Test Kits
Series 40
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The CT Series 40 CAM/TRAC mechanical kits, utilizing the patented CAM mechanism, offer precise Z axis linear motion when testing higher point count and finer pitch test centers. By using the Z axis motion, side load of the test probes is minimized thus increasing probe life and performance.
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Product
Semiconductor
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You can find Spring probes used for test process for production of semiconductor here. Spring probe is probe with spring inside and is also called Double-ended probe and Contact probe. It is assembled in IC socket and becomes electronic path, which vertically connects Semiconductor and PCB. By our excellent machining technique, we can provide spring probe with low contact resistance and long life. “MARATHON” series is our standard lineup of spring probe for testing semiconductor.
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Product
High Frequency/Microwave
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SemiProbe high frequency probing solutions provide a broad array of capabilities for measurements ranging from DC to over 300 GHz. We design PS4L systems for high frequency applications with carefully selected components including chucks, probe arms, probes, cables, tuner modules, and calibration suites that are optimized for the frequency range that the application will operate in.
