Wafer Thickness
See Also: Wafer, Wafer Failure Analysis, Wafer Edge, Wafer Resistivity, Wafer Mapping, Wafer Probes, Wafer Probers, Wafer Inspection, Four Point Probes
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Wafer Flatness Measurement System
FLA-200
*Measures Thickness, TTV, Bow, Warp and site and global Flatness (ASTM compliance)*Measures all materials including Si, GaAs, Ge, InP, SiC*Full 500 micron thickness measurement range without re-*calibration2-D /3-D Mapping software
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Underwater Thickness Gauge
Multigauge 4000
The Multigauge 4100 and 4400 ROV Underwater Thickness Gauges mount onto most types ROV. There are two models in the range, the Multigauge 4100 which has a depth rating of 1000m and the Titanium Multigauge 4400 which has a depth rating of 4000m.
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Production Wafer Level Burn-in
TV19 VersaTile™ probe cards are designed with Celadon’s patented ceramic technology for superior electrical performance, yet is highly modular due to it’s 28mm x 28mm chassis. Micro-adjustments can be made in seconds with an allen wrench and a microscope. Easily align VersaTile cards for different wafer layouts using a 4.5” compatible 1×3 , 200mm, or 300mm VersAdjust plate.
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Ultrasonic Thickness Gauge
45MG
The 45MG is an advanced ultrasonic thickness gauge packed with standard measurement features and software options. This unique instrument is compatible with the complete range of Olympus dual element and single element thickness gauge transducers, making this innovative instrument an all-in-one solution for virtually every thickness gauge application.
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Film Thickness Probe
FTPadv
The SE 500adv combines ellipsometry and reflectometry to eliminate the ambiguity of measuring layer thickness of transparent films. It extends the measureable thickness to 25 µm. Therefore the SE 500adv extends the capability of the standard laser ellipsometer SE 400adv especially for analyzing thicker films of dielectrics, organic materials, photoresists, silicon, and polysilicon.
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System to Handle Wafer Levels
AMI AW Series
Operator-Free Wafer Inspection, Analysis and Sorting The AW Series are advanced high-capacity, high throughput automated wafer C-SAM® instruments specialized to deliver maximum sensitivity for the evaluation of wafer and device level applications.
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Ultrasonic Thickness Gauge
MMX-6
The MMX-6 is a simple to use hand-held Ultrasonic Thickness Gauge with the ability to measure through paint and coatings and eliminate the thickness of the paint or coating. The MMX-6 uses a dual element style transducer. With the single press of a button, the MMX-6 can be switched between pit or flaw mode ( pulse-echo), and through paint/coatings mode (echo-echo) for maximum inspection efficiency. The MMX-6 is equipped with a bundle of features to make your job easier: Alarm mode, high speed scanning, and data send are the main features of the MMX-6. The MMX-6 comes as a complete kit, ready to use, and is backed by Dakota Ultrasonics 5 year limited warranty.
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Ultrasonic Thickness Gauge
MX-5 DL
The MX-5 DL is a simple to operate Ultrasonic Thickness Gauge with an internal data logger. It offers features that make your job easier. An Alarm mode, Differential mode, high speed scanning, and data send are the main features of the MX-5 DL. The MX-5 DL will automatically log your readings in numeric order ( 1 to 1000 readings ). The gauge comes as a complete kit, ready to use, and is backed by Dakota Ultrasonics 5 year limited warranty.
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Semiconductor Wafer Defect Inspection Management Software
ProcessGuard
Microtronic ProcessGUARD Software is the desktop client for the EagleView auto macro wafer defect inspection system. ProcessGUARD is a high volume, high speed semiconductor wafer defect inspection management solution that provides an easy-to-use, customizable and extensible platform and interface to automate your fabs defect inspection process. ProcessGUARD is feature rich (see below) and its newest releases include complete wafer randomization software, a user-defined defect library, and an integrated trainer and knowledge base.
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Thin-Film Thickness Measurement Systems
The Filmetrics® range of affordable reflectometers deliver high-precision thin-film thickness measurements in seconds. These easy-to-use tools, combined with intelligent software and a broad range of accessories and configurations, provide maximum versatility in film thickness measurements ranging from 1nm to 3mm.
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Industrial Paint & Powder Thickness Gauge
415
Incredibly fast (60+ readings per minute), reducing inspection times, increasing productivitySwitches instantly between ferrous & non-ferrous substrates without interruption1Measures cured paint & powder coatings up to 1000μm (40mils)Zero or smooth (2 point) calibration ensures accuracy on smooth & thin coated substratesEasy to use, ergonomic design provides maximum comfort for continuous useLarge easy to read values in microns or milsAuto rotating large colour display provides clear visibility whatever the angle of measurementScratch, solvent & water resistant display protects against the elementsRugged & resistant to dust or powder coatings equivalent to IP64, ideal for modern industrial & powder coating environmentsTransfer live data via USB or Bluetooth® to ElcoMaster® for instant report generation
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Wall Thickness Measurement Gauges
ElektroPhysik Dr. Steingroever GmbH & Co. KG
Portable wall thickness measuring device for non-destructive measurement of up to 24 mm. Thickness measurement of all non-magnetic materials such as glass, synthetic materials, stainless steel and composites; can also be used for objects with complex geometries.
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Coating Thickness Gauge
Meter MEGA-CHECK -Basic
The new generation of MEGA-CHECK devices first used probes in which an own microcontroller, the analog sensor signals are digitized to the device outputs. This new technique is extremely trouble-free and even allows accurate and repeatable readings. The probe cable is both sides (control unit and probe) and therefore particularly service-friendly, as if a cable breaks, the device must not be returned, but only the cable is replaced. The units are equipped with a large, clear and illuminated graphic display. A variety of Fe, ferrous and dual
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Film Thickness Mapping Systems
Angstrom Sun Technologies, Inc.
Spectroscopic reflectometer mapping (SRM) tools are for industry or lab routine thin film uniformity measurement. This is relatively low cost and easy to use setup. Mapping size can be configured from 2" to 18" if needed. Dependent on film thickness range, a broad wavelength range can be configured within DUV, Vis and/or NIR range. A user-friendly software interface allows you to define various mapping patterns to map. A CCD array based detecting and data acquisition mechanism offers fast measurements. 2D/3D data presentation gives user option to quickly generate reports.
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Wafer Prober
Precio octo
200mm wafer prober. The system adapts ultra-high speed indexing and high-speed wafer exchange functions to reduce test cost and improve overall equipment effectiveness (OEE) markedly enhancing productivity.
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Portable Thickness Gauge
Magna-Mike 8600
The Magna-Mike® 8600 is a portable thickness gauge that uses a simple magnetic method to make reliable and repeatable measurements on nonferrous materials. Operation of the Magna-Mike is very simple. Measurements are made when its magnetic probe is held or scanned on one side of the test material and a small target ball (or disk or wire) is placed on the opposite side or dropped inside a container.
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Flatness, Bow, Warp, Curvature, Glass Thickness
1D-glass Thickness Profile Measuring Instrument GPM2
Optik Elektronik Gerätetechnik GmbH
Highly accurate automatic measurement of glass thickness distributions. The glass thickness profiler GPM has the function to execute a fast and precise determination of the thickness profile of flat glass samples or another transparent material with a thickness range from 30µm to 700µm (option with sensor type 1) and width to 1200mm. The measuring point distance of the profile measurement can be varied over a micro-step-controlled positioning steering between 0.1mm and 1mm. The measured value accommodation for a scanning point takes place with the help of a special hardware module for image processing algorithms within 40 ms. The entire measuring time for a sample results thus as product from the sample width which has to be measured, the measuring point distance and the measuring time per measuring point.
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Asphalt Layer Thickness Measurement Devices
ElektroPhysik Dr. Steingroever GmbH & Co. KG
Non-destructive road layer thickness measuring gauge to measure bituminous road layers or other electrically insulating road layers.
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Wafer & Die Inspection
SemiProbe wafer inspection system (WIS) examines, locates and identifies defects created during wafer manufacturing, probing, bumping, dicing or general handling. This provides microelectronic device manufacturers with accurate, timely quality assurance and process information. The WIS has single sided and double sided wafer mapping capabilities and can improve efficiency, reduce manufacturing costs, increase yields and shorten time to market.
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Stand Alone Wafer Sorter
MicroSORT
The Microtronic MicroSORT semiconductor wafer sorter is designed to maximize throughput while minimizing wafer handling in a user-friendly operating environment. This stand-alone semiconductor wafer sorter enables sophisticated semiconductor wafer sorter routines for up to 4 wafer-cassette platforms. MicroSORT semiconductor wafer sorter reads OCR scribes from the top, bottom, or simultaneously, allowing for enhanced semiconductor wafer tracking and sorting. The MicroSORT semiconductor wafer sorter’s basic functions include the ability to move, compress, randomize, find, align, verify, and split semiconductor wafer lots. With our virtual tweezer mode, an operator can click on wafer icons to move wafers between cassettes, read semiconductor wafers, and swap wafer positions.
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Ultrasonic Thickness Guage
KM 130D
Kusam Electrical Industries Limited
Ultrasonic Thickness Guage is an intelligent hand held meter which adopts ultrasonic measuring principle, & is controlled by micro processor, provides quick & precise measurement of thickness for most of industrial material. This unit is widely used in various precise measurement for different hard ware / parts in industrial realm; one of its important application is to monitor the level of thickness-decreasing during operation of various & pressure container. Diffusely applied in manufacture fields, metal processing, and commercial inspection. The material that conduct & reflect constant sonic velocity, this product is to be applicable to used.
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Film and Paper Thickness Gauges
Economical, Accurate, Easy-to-Operate, our line of off-line paper / film thickness gauges are manufactured to meet TAPPI specifications for paper or ASTM specifications for film.
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Ultrasonic Thickness Gauge
Shenzhen Linshang Technology Co., Ltd.
Ultrasonic thickness gauges (ultrasonic thickness testers, ultrasonic wall thickness gauges, ultrasonic thickness meters, etc.) measure the wall thickness of materials such as steel, plastic, and more using ultrasonic technology which is ideal for measuring the effects of corrosion on metal, pipes or any structure where access is limited to one side.
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Coating Thickness Gauges
Coating thickness gauges are used to test the dry film thickness of most metals, plus concrete, fibreglass, glass, and plastic. The gauges can measure coatings on ferrous substrates, such as steel, and non-ferrous substrates, such as stainless steel and aluminium and non-metals such as concrete, fibreglass, glass, plastic, gyprock and timber.
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ECHO 9 Advanced Corrosion Thickness Gages
ECHO 9
ECHO 9 offers a 3.5” high resolution sunlight readable color display with live A-Scan, echo to echo to ignore coatings, B-Scan, datalogger with up to 32GB of SD card memory and interface to Microsoft excel. The ECHO 9 is available in 4 models including the ECHO 9, ECHO 9DL, ECHO 9W and ECHO 9DLW.
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Handheld Gauge for Nondestructive Coating Thickness Measurement
PHASCOPE PMP10 DUPLEX
The professional for duplex measuring. The specialist for measuring the thickness of duplex layers from automotive to roof panels.
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Material Thickness Meters
Choose from a variety of material thickness meter, mil gage or paint meter products used for the non-destructive measurement of nonmagnetic coating, insulating layer and dry film thickness (DFT) on ferrous and / or non-ferrous metal substrates such as steel and aluminum. Explore PCE Instruments' selection of accurate, affordable material thickness meter, coating thickness gauge, surface testing and film gauge devices used for automotive paint inspection, material testing and manufacturing quality control applications.A material thickness meter is an essential quality assurance tool when anodizing, galvanizing and applying zinc coating to metallic surfaces. A material thickness meter also is used to measure body paint thickness and uniformity on pre-owned cars, revealing repainted spots, identifying hidden damages and exposing undisclosed accidents. This information is important when determining the actual value of a used car. In addition, certain types of thickness meters can measure wall thickness and determine the hardness of metals, plastics and glass.
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Geotextile Thickness Tester (Wet Sieving)
TG040
TESTEX Testing Equipment Systems Ltd.
Geotextile Thinkness Tester, to determine the thickness of geotextile synthetic materials and related products under pressure and in specified time.
